Analog Product Engineer

Product engineering (PE) works with our design, systems and back-end (test/val) teams to ensure a product is designed for manufacturability and reliability.

PEs usually work on a product family or category and ensure that those devices are meeting specifications and quality targets as defined in our data sheets.

In addition, PEs may be responsible for sustaining support, meaning they work with design, ATD (process technology), SCP (packaging), manufacturing, test, quality, reliability, and marketing teams to further optimize the manufacturing flow of a given device, targeting to reduce cost or otherwise improve the overall long-term development and profit profile of the device post-release.Responsibilities may include, but are not limited to:Development work in support of a broad range of Power devices (Buck converter multiphase controller, power stages, Power sequencers, etc.)Collaborate and work in a team environment with Design, Applications, Test, Marketing, Manufacturing, Quality and Reliability in all aspects of new product development, production release to accomplish goals and objectivesDesign sHTOL, dHTOL, ELFR, BHAST, and PTC boards to qualify Power productsPerform evaluation, debug and characterization of integrated circuits to ensure they meet the product requirement specifications and manufacturing requirementsWork with failure analysis (FA) to determine root cause of any reliability and qualification failuresWork with process and package technology development to develop and qualify technologies for new product developmentWork closely with the global manufacturing facilities to address customer specific product quality, yield management and cost reductions issues on mature products.

Scope of work could include product spins and derivativesWork with planning team to ensure smooth device ramp post release to manufacturing (RTM)Qualify second source wafer fab, assembly / test (A/T) facility, and Bill of Materials (BOM) to ensure device continuity of supplyPerform test conversion, test time reduction, and yield improvements to achieve device entitlement operational